Instrumentation

The probe-corrected ARM200F is a state-of-the-art (S)TEM with exceptional stability and the capability to produce a very small probe. The microscope is also equipped with advanced EELS and EDX systems for chemical analysis. High energy resolution at high spatial resolution is thus obtainable. The system is set up for operation at voltages of 30 kV, 60 kV, 80 kV and 200 kV. Sample holders for in-situ heating and cooling as well as for electron tomography are available.

JEOL ARM200F - Probe Corrected

The probe-corrected ARM200F is a state-of-the-art (S)TEM with exceptional stability and the capability to produce a very small probe. The microscope is also equipped with advanced EELS and EDX systems for chemical analysis. High energy resolution at high spatial resolution is thus obtainable. The system is set up for operation at voltages of 30 kV, 60 kV, 80 kV and 200 kV. Sample holders for in-situ heating and cooling as well as for electron tomography are available. [more]
The image-corrected ARM200F incorporates the latest developments in TEM to give excellent spatial resolution in HRTEM imaging. It has a cold field-emission gun, with a range of available accelerating voltages (30 kV, 60 kV, 80 kV and 200 kV). It has state-of-the art EELS and EDX systems for advanced chemical analysis. The system includes HAADF, ABF, and BF detectors, and can accommodate sample holders for in-situ heating and cooling as well as for electron tomography.

JEOL ARM200F - Image Corrected

The image-corrected ARM200F incorporates the latest developments in TEM to give excellent spatial resolution in HRTEM imaging. It has a cold field-emission gun, with a range of available accelerating voltages (30 kV, 60 kV, 80 kV and 200 kV). It has state-of-the art EELS and EDX systems for advanced chemical analysis. The system includes HAADF, ABF, and BF detectors, and can accommodate sample holders for in-situ heating and cooling as well as for electron tomography. [more]
The sub-electron-volt sub-angstrom microscope is a unique TEM, with a monochromator and an in-column MANDOLINE energy filter. The microscope column is suspended from an ultrastable support frame to provide excellent isolation. The SESAM was developed to provide the best performance in analytical electron microscopy combined with very high spatial resolution. It remains one of the best uncorrected TEMs for analytical work.

Zeiss SESAM

The sub-electron-volt sub-angstrom microscope is a unique TEM, with a monochromator and an in-column MANDOLINE energy filter. The microscope column is suspended from an ultrastable support frame to provide excellent isolation. The SESAM was developed to provide the best performance in analytical electron microscopy combined with very high spatial resolution. It remains one of the best uncorrected TEMs for analytical work. [more]
The ARM 1250 was designed to maximize image resolution through the use of a high accelerating voltage. It has a LaB6 source that can be operated at an accelerating voltage of up to 1250 kV. The large size of the components required to support this voltage mean this TEM takes up two storeys, which is a factor in the rarity of instruments with this design. This TEM is suitable for in-situ experiments with a video system installed and an incorporated drift-correction system.

JEOL ARM1250

The ARM 1250 was designed to maximize image resolution through the use of a high accelerating voltage. It has a LaB6 source that can be operated at an accelerating voltage of up to 1250 kV. The large size of the components required to support this voltage mean this TEM takes up two storeys, which is a factor in the rarity of instruments with this design. This TEM is suitable for in-situ experiments with a video system installed and an incorporated drift-correction system. [more]
The JEOL 4000FX is a classical TEM with a LaB6 source and no energy filter. It is typically operated at 400kV and is set up for high-resolution imaging. It can accept heating and cooling holders but has only a moderate tilt range available. With the system’s capability to continuously capture the image from the microscope, in-situ heating experiments, for example, can be performed and fully recorded in video form for later analysis.

JEOL 4000FX

The JEOL 4000FX is a classical TEM with a LaB6 source and no energy filter. It is typically operated at 400kV and is set up for high-resolution imaging. It can accept heating and cooling holders but has only a moderate tilt range available. With the system’s capability to continuously capture the image from the microscope, in-situ heating experiments, for example, can be performed and fully recorded in video form for later analysis. [more]
The EM 912 TEM is an excellent microscope for tomography. It has the highest possible tilt range of our TEMs. This TEM has a LaB6 source and is equipped with an Omega in-column energy filter. It can accept heating, cooling and rotation specimen holders as well as the high-tilt holder required for tomography.

Zeiss 912 Omega

The EM 912 TEM is an excellent microscope for tomography. It has the highest possible tilt range of our TEMs. This TEM has a LaB6 source and is equipped with an Omega in-column energy filter. It can accept heating, cooling and rotation specimen holders as well as the high-tilt holder required for tomography. [more]
The CM200 is a widely-used microscope, excellent for conventional TEM work. It has a LaB6 source, operated with a 200kV accelerating voltage. This TEM is ideal for bright field and dark field imaging, and for dislocation and defect analysis using diffraction contrast imaging, including the weak-beam dark field technique. The available range for tilting is large and the microscope can accommodate a cooling holder.

Philips CM200

The CM200 is a widely-used microscope, excellent for conventional TEM work. It has a LaB6 source, operated with a 200kV accelerating voltage. This TEM is ideal for bright field and dark field imaging, and for dislocation and defect analysis using diffraction contrast imaging, including the weak-beam dark field technique. The available range for tilting is large and the microscope can accommodate a cooling holder. [more]
The group has three SEMs, excellent for imaging, EDX or WDX. The LEO 438VP allows large tilt angles and can be used for orientation imaging microscopy. The EPMA Cameca SX 100 is used for WDX and has special anti-contamination equipment installed. The Zeiss DSM 982 Gemini is the highest resolution SEM in the group.

SEMs

The group has three SEMs, excellent for imaging, EDX or WDX. The LEO 438VP allows large tilt angles and can be used for orientation imaging microscopy. The EPMA Cameca SX 100 is used for WDX and has special anti-contamination equipment installed. The Zeiss DSM 982 Gemini is the highest resolution SEM in the group. [more]
 
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