Proceedings

2014

Langenhorst, F.; Harries, D.; Pollok, K.; van Aken, P. A.:
Evidence for microimpact in an olivine-dominated Hayabusa dust particle. In: Meteoritics & Planetary Science, A226 (2014)


Liang, Q.; Talebi, N.; Yu, W.; van Aken, P. A.:
Electron Impact Investigation Of Hybridization Scheme In Coupled Split-Ring Resonators. In: 8th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics – Metamaterials 2014, 187-189 8th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics – Metamaterials 2014, Kopenhagen, 2014-08-25 - 2014-08-25. IEEE (2014)

2012

Detemple, E.; Ramasse, Q.; Sigle, W.; Benckiser, E.; Cristiani, G.; Habermeier, H.-U.; Keimer, B.; van Aken, P. A.
NiO precipitates in LaNiO3/LaAlO3 superlattices induced by a polar mismatch. In: Frontiers in Electronic Materials, 135-136 (Hrsg. Heber, J.; Schlom, D.;
Tokura, Y.; Waser, R.; Wuttig, M.). Frontiers in Electronic Materials, Aachen, Germany, 2012-06-17 - 2012-06-17. Wiley-VCH, Weinheim, Germany (2012)


Detemple, E.; Ramasse, Q.; Sigle, W.; Cristiani, G.; Habermeier, H.-U.; Keimer, B.; van Aken, P. A.:
Ruddlesden-Popper type faults in LaNiO3/LaAlO3. In: Frontiers in Electronic Materials, 138-139 (Hrsg. Heber, J.; Schlom, D.; Tokura, Y.; Waser, R.; Wuttig, M.). Frontiers in Electronic Materials, Aachen, Germany, 2012-06-17 - 2012-06-17. Wiley-VCH Verlag & Co. KGaA, Weinheim, Germany (2012)

2011

Liu, Z.; Srot, V.; Yang, J.:
Crystalline silcion carbide Y junctions induced by catalysts coalescence. In: Microscopy and Microanalysis, 1900-1901 Microscopy and Microanalysis 2011, Nashville, Tennessee, 2011-08-07 - 2011-08-07. (2011)


Özdöl, V. B.; Koch, C. T.; van Aken, P. A.:
Low-dose strain mapping by dark-field inline electron holography. In: Microscopy and Microanalysis, 1228-1229 Microscopy and Microanalysis 2011, Nashville, Tennessee, 2011-08-07 - 2011-08-07. (2011)


Sigle, W.; Gu, L.; Talebi, N.; Ögüt, B.; Koch, C. T.; Vogelgesang, R.; van Aken, P. A.:
EELS and EFTEM of surface plasmons in metallic nanostructures. In: Microscopy and Microanalysis, 762-763 Microscopy and Microanalysis 2011, Nashville, Tennessee, 2011-08-07 - 2011-08-07. (2011)


Srot, V.; Bussmann, B.; Salzberger, U.; Koch, C. T.; Cizmek, G.; van Aken, P. A.:
Characterization of dentine, dentinal tubules and dentine-enamel junction in human teeth by advanced analytical TEM. In: Microscopy and Microanalysis, 286-287 Microscopy and Microanalysis 2011, Nashville, Tennessee, 2011-08-07 - 2011-08-07. (2011)

2010

Aydogdu, G. H.; Kuru, Y.; Nelayah, J.; van Aken, P. A.; Habermeier, H.-U.:
Thickness dependent microstructural changes in La0.5Ca0.5MnO3 thin films deposited on (111) SrTiO3. In: Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II, 4667-4669 (Hrsg. Craciun, V.; Guilloux-Viry, M.; Alexe, M.; Krämer, J. L. C.; Mosnier, a. J.-P.). EMRS 2009 Spring Meeting, Strasbourg, France, 2009-06-08 - 2009-06-08. (2010)


Essers, E.; Benner, G.; Mandler, T.; Meyer, S.; Mittmann, D.; Schnell, M.; Höschen, R.:
Energy resolution of a Omega-type monochromator and imaging properties of the MANDOLINE filter. In: Proceedings of the International Workshop on Enhanced Data Generated by Electrons, 971-980 (Hrsg. Kothleitner, G.). International Workshop on Enhanced Data Generated by Electrons (EDGE 2009), Banff, Alberta, Canada, 2009-05-17 - 2009-05-17. (2010)


Jin-Phillipp, N. Y.; Koch, C. T.; van Aken, P. A.:
3D Elemental mapping in nanomaterials by core-loss EFTEM tomography. In: Microscopy and Microanalysis, 1842-1843 Microscopy and Microanalysis 2010, Portland, Oregon, USA, 2010-08-01 - 2010-08-01. (2010)


Koch, C. T.:
Quantitative analysis of crystal defects: towards 3-dimensional imaging of charge densities and atomic structure by inline electron holography. In: Microscopy and Microanalysis, 1478-1479 Microscopy and Microanalysis 2010, Portland, Oregon, USA, 2010-08-01 - 2010-08-01. (2010)


Koch, C. T.:
Determination of grain-boundary potentials in ceramics: Combining impedance spectroscopy and inline electron holography. In: International Journal of Materials Research, 43-49 7th International Workshop on Interfaces - New Materials via Interfacial Control, Santiago de Compostela, Spain, 2008-06-22 - 2008-06-22. (2010)


Łaszcz, A.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Phillipp, F.; van Aken, P. A.; Katcki, J.:
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers. In: Journal of Microscopy, 347-351 EM 2008 - XIII International Conference on Electron Microscopy, Zakopane, Poland, 2008-06-08 - 2008-06-08. (2010)


Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.Characterization of ytterbium silicide formed in ultra high vacuum. In: Journal of Physics: Conference Series 16th International Conference on Microscopy of Semiconducting Materials, Oxford, United Kingdom, 2009-03-17 - 2009-03-17. (2010)


Özdöl, V. B.; Koch, C. T.; van Aken, P. A.:
Strain mapping of 45 nm MOSFET by dark-field inline electron holography. In: Microscopy and Microanalysis, 592-593 Microscopy and Microanalysis 2010, Portland, Oregon, USA, 2010-08-01 - 2010-08-01. (2010)


Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E.:
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. In: Journal of Microscopy, 379-383 EM 2008 - XIII International Conference on Electron Microscopy, Zakopane, Poland, 2008-06-08 - 2008-06-08. (2010)


Srot, V.; Wegst, U. G. K.; Salzberger, U.; Koch, C. T.; van Aken, P. A.:
ELNES investigations of interfaces in abalone shell. In: Microscopy and Microanalysis, 1218-1219 Microscopy and Microanalysis 2010, Portland, Oregon, USA, 2010-08-01 - 2010-08-01. (2010)


van Aken, P. A.; Sigle, W.; Koch, C. T.; Ögüt, B.; Nelayah, J.; Gu, L.:
Low-loss EFTEM imaging of surface plasmon resonances in Ag nanostructures. In: Microscopy and Microanalysis, 1438-1439 Microscopy and Microanalysis 2010, Portland, Oregon, USA, 2010-08-01 - 2010-08-01. (2010)

2009

Balci, S.; Bittner, A. M.; Schirra, M.; Thonke, K.; Sauer, R.; Hahn, K.; Kadri, A.; Wege, C.; Jeske, H.; Kern, K.:
Catalytic coating of virus particles with zinc oxide. In: Electrochimica Acta, 5149-5154 59th Annual Meeting of the International Society of Electrochemistry, Seville, Spain, 2008-09-07 - 2008-09-07. (2009)


Castillo Rodríguez, M.; Sigle, W.:
Dislocation microstructure in strontium titanate plastically deformed at low temperature. In: MC2009. Vol. 3: Materials Science, 297-298 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Deuschle, J. K.; Deuschle, H. M.; Enders, S.; Arzt, E.:
Contact area determination in indentation testing of elastomers. In: Journal of Materials Research, 736-748 International Symposium on Indentation Behavior of Materials, Heiderabad, India, 2008-02 - 2008-02. (2009)


Gec, M.; Žagar, K.; Bußmann, B.; van Aken, P. A.; Čeh, M.:
Preparation of nanotubes for cross-sectional TEM/STEM observations. In: MC2009. Vol. 1: Instrumentation and Methodology, 145-146 (Hrsg. Kothleitner, G.; Leisch, M.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz, Austria (2009)


Jin-Phillipp, N. Y.; Koch, C. T.; van Aken, P. A.:
EFTEM tomography on nanomaterials. In: MC2009. Vol. 1: Instrumentation and Methodology, 73-74 (Hrsg. Kothleitner, G.; Leisch, M.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Koch, C. T.; Rahmati, B.; Sigle, W.; Shirpour, M.; Merkle, R.; Maier, J.; van Aken, P. A.:
Mapping grain boundary potentials in ceramics by nonlinear inline electron holography and impedance spectroscopy. In: MC2009. Vol. 3: Materials Science, 329-330 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Krüger, H.; Phillipp, F.:
In-situ TEM studies of a phase transition in Ca2Fe2O5. In: MC2009. Vol. 3: Materials Science, 293-294 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
HRTEM characterization of erbium silicide formed in ultra-high vacuum. In: MC2009. Vol. 3: Materials Science, 31-32 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Ögüt, B.; Sigle, W.; Nelayah, J.; Koch, C. T.; van Aken, P. A.:
Study of surface plasmon resonances on assemblies of slits in thin Ag films by low-loss EFTEM imaging. In: MC2009. Vol. 1: Instrumentation and Methodology, 131-132 (Hrsg. Kothleitner, G.; Leisch, M.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz, Austria (2009)


Özdöl, V. B.; Koch, C. T.; Phillipp, F.; van Aken, P. A.:
Strain measurements on Si/SiGe heterostructures using HRTEM. In: MC2009. Vol. 3: Materials Science, 447-448 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Richter, G.; Hillerich, K.; Kelsch, M.; Hahn, K.; Lang, D.:
Investigation of single-crystalline nano-whiskers by different TEM-methods. In: MC2009. Vol. 3: Materials Science, 99-100 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Sigle, W.; Nelayah, J.; Koch, C. T.; Ögüt, B.; van Aken, P. A.:
Surface plasmon resonance effects in a perforated Ag film studied by energy-filtering TEM. In: MC2009. Vol. 1: Instrumentation and Methodology, 111-112 (Hrsg. Kothleitner, G.; Leisch, M.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Sigle, W.:
Analytical transmission electron microscopy. In: MC2009. Vol. 3: Materials Science, 7-12 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)


Srot, V.; Wegst, U. G. K.; van Aken, P. A.; Koch, C. T.; Salzberger, U.:
ELNES studies of abalone shell and geological CaCO3 polymorphs. In: MC2009. Vol. 3: Materials Science, 287-288 (Hrsg. Grogger, W.; Hofer, F.; Pölt, P.). MC2009, Microscopy Conference, Graz, Austria, 2009-08-30 - 2009-08-30. Verlag der Technischen Universität Graz, Austria, Graz (2009)

2008

Bellina, P. J.; Phillipp, F.; van Aken, P. A.:
In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 (100) and (110) surfaces at high temperature. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 471-472 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Bhattacharyya, S.; Höche, T.; Bocker, C.; Rüssel, C.; Duran, A.; Hémono, N.; Muñoz, F.; Pascual, M. J.; Hahn, K.; van Aken, P. A.
Studying nanocrystallization behaviour of different inorganic glasses using transmission electron microscopy. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 523-524 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al. (2008)


Deneke, C.; Schumann, J.; Engelhard, R.; Thomas, J.; Sigle, W.; Zschieschang, U.; Klauk, H.; Chuvilin, A.; Schmidt, O. G.
Fabrication of radial superlattices based on different hybrid materials. In: 34th International Symposium on Compound Semiconductors (ISCS-2007), 2704-2708 (Hrsg. Hirayama, Y.; Sogawa, T.). Optics of Surfaces and Interfaces (OSI-VII), Alta, Wyoming,USA, 2007-07-15 - 2007-07-15. (2008)


Du, K.; Phillipp, F.; Rühle, M.:
Quantitative image matching between experimental and simulated high-resolution transmission electron micrographs. In: Korean Journal of Microscopy, 514-515 The 9th Asia-Pacific Microscopy Conference (APMC9), Jeju, South Korea, 2008-11-02 - 2008-11-02. (2008)


Gec, M.; Toplišek, T.; Srot, V.; Dražić, G.; Kobe, S.; van Aken, P. A.; Čeh, M.:
Preparation of SiC/SiC thin foils for TEM observations by wedge polishing method. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 817-818 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Gu, L.; Sigle, W.; Koch, C. T.; Srot, V.; Nelayah, J.; van Aken, P. A.:
Band gap mapping using monochromated electrons. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 381-382 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Gu, L.; Srot, V.; Sigle, W.; Koch, C.; van Aken, P.:
VEELS band gap measurements using monochromated electrons. In: Journal of Physics: Conference Series Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007), Glasgow, UK, 2007-09-03 - 2007-09-03. (2008)


Haider, M.; Hartel, P.; Löbau, U.; Höschen, R.; Müller, H.; Uhlemann, S.; Kahl, F.; Zach, J.:
Progress on the development of a Cc/Cs corrector for TEAM. In: Microscopy and Microanalysis, 800CD-801CD Microscopy and Microanalysis 2008, Albuquerque, New Mexico, USA, 2008-08-03 - 2008-08-03. Cambridge Univ. Press, Cambridge, UK [et al.] (2008)


Hetschel, T.; Wolter, K.-J.; Phillipp, F.:
Wettability effects of immersion tin final finishes with lead-free solders. In: 2nd Electronics System-Integration Technology Conference, 561-566 2nd Electronics System-Integration Technology Conference, Greenwich, UK, 2008-09-01 - 2008-09-01. IEEE, Piscataway, NJ (2008)


Höche, T.; Heyroth, F.; van Aken, P. A.; Schrempel, F.; Henderson, G. S.; Blyth, R. I. R.:
Amorphisation in fresnoite compounds – a combined ELNES and XANES study. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 821-822 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Höland, W.; Ritzberger, C.; Rothbrust, F.; Kappert, H.; Rheinberger, V. M.; Krumeich, F.; Nesper, R.; Sigle, W.; van Aken, P. A.
Glass-ceramics and coloured ZrO2 ceramics for dental restoration. In: "Global Roadmap for Ceramics - ICC2 Proceedings" (Hrsg. Vincenzini, P.). 2nd
International Congress on Ceramics, ICC2, Verona, Italy, 2008-06-29 - 2008-06-29. Institute of Science and Technology for Ceramics - ISTEC-, Faenza, Faenza (2008)


Jin-Phillipp, N. Y.; Nolte, P.; Stierle, A.; van Aken, P. A.; Dosch, H.:
Direct observation of surface oxidation of Rh nanoparticles on (001) MgO. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 225-226 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Jost, M.; Atanasova, P.; Gerstel, P.; Sigle, W.; van Aken, P. A.; Bill, J.:
DNA - directed synthesis of ZnO nanowires. In: From Biological Materials to Biomimetic Material Synthesis, DD03-DD08 (Hrsg. Kröger, N.; Qiu, R.; Naik KApplied Physics Lettersan D., R.). Symposium DD: From Biological Materials to Biomimetic Material Synthesis at MRS Spring Meeting 2008., San Francisco, CA, USA, 2008-03-24 - 2008-03-24. Materials Research Society, Warrendale, PA, USA (2008)


Koch, C. T.; Bellina, P.; van Aken, P. A.:
Software precession electron diffraction. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 201-202 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Koch, C. T.; Rahmati, B.; van Aken, P. A.:
Nonlinear electron inline holography. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 261-264 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Koch, C. T.; Sigle, W.; Nelayah, J.; Gu, L.; Srot, V.; van Aken, P. A.:
Sub-0.5 eV EFTEM mapping using the Zeiss SESAM. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 447-448 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Laszcz, A.; Ratajczak, J.; Czerwinski, A.; Katcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Breil, N.; Larrieu, G.; Dubois, E.
Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO2/Si structure. In: Materials Science and Engineering B, 175-178 E-MRS Spring Meeting 2008, Strasbourg, France, 2008-05-26 - 2008-05-26. (2008)


Liu, Z.; Srot, V.; van Aken, P. A.; Rühle, M.; Yang, C. T.:
Silicon carbide nanowire heterostructures constructed from released iron catalysis. In: Nanowires—Novel Assembly Concepts and Device Integration (Hrsg. Mayer, T. S.). MRS Fall Meeting 2007, Boston, MA, USA, 2007-11-26 - 2007-11-26. Materials Research Society, Warrendale, PA, USA (2008)


Meng, Y.; Nolze, G.; Zhang, W. Z.; Gu, L.; van Aken, P. A.:
Determination of precise orientation relationships between surface precipitates and matrix in a duplex stainless steel. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 659-660 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Nelayah, J.; Gu, L.; Sigle, W.; Koch, C. T.; Pastoriza-Santos, L.; Liz-Marzan, L. M.; van Aken, P. A.:
Low-loss-energy EFTEM imaging of triangular silver nanoparticles. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 243-244 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al. (2008)


Özdöl, V. B.; Phillipp, F.; Kasper, E.; van Aken, P. A.:
Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, 141-142 (Hrsg. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Phillipp, F.; Bellina, P. J.; Lee, S. B.; Messer, R.; van Aken, P. A.:
In-situ atomic resolution HVEM studies of strontium titanate at high temperatures. In: Korean Journal of Microscopy, 102-103 The 9th Asia-Pacific Microscopy Conference (APMC9), Jeju, South Korea, 2008-11-02 - 2008-11-02. (2008)


Rahmati, B.; Sigle, W.; Fleig, J.; Konuma, M.; Eigenthaler, U.; Koch, C.; van Aken, P. A.; Rühle, M.:
Effect of surface orientation on island formation on SrTiO3 surfaces. In: Interfacial Nanostructures in Ceramics: a Multiscale Approach (Hrsg. Finnis, M.; Gautier-Soyer, M.; Hoffmann, M.). E-MRS Spring Meeting 2007, Strasbourg, France, 2007-05-28 - 2007-05-28. (2008)


Rahmati, B.; Gregori, G.; Sigle, W.; Koch, C. T.; van Aken, P. A.; Maier, J.:
Analytical and high-resolution TEM investigation of boron-doped CeO2. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 565-566 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Sigle, W.; Gu, L.; Koch, C.; Srot, V.; Nelayah, J.; van Aken, P. A.:
Application of monochromated electrons in EELS. In: Microscopy and Microanalysis, 134-135 Microscopy and Microanalysis 2008. Microscopy Society of America, 66th Annual Meeting. Microbeam Analysis Society, 42nd Annual Meeting. International Metallographic Society, 41st Annual Meeting, Albuquerque, New Mexico, USA, 2008-08-03 - 2008-08-03. Cambridge Press, Cambridge, UK [et al.] (2008)


Sigle, W.; Kaiser, T.; Goll, D.; Goo, N. H.; Srot, V.; van Aken, P. A.; Detemple, E.; Jäger, W.:
Study of the intermixing of Fe–Pt multilayers by analytical and high-resolution transmission electron microscopy. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 109-110 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al. (2008)


Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.:
Analytical TEM investigations of Pt/YSZ interfaces. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, 369-370 (Hrsg. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, 2008-09-01 - 2008-09-01. Springer, Berlin [et al.] (2008)


Stegmann, H.; Özdöl, V. B.; Koch, C.; van Aken, P. A.; Engelmann, J.; Potapov, P.; Zschech, E.:
Chemical bonds in damaged and pristine low-κ materials: A comparative EELS study. In: Microelectronic Engineering, 2169-2171 Twelfth European Workshop on Materials for Advanced Metallization 2008 (MAM2008), Dresden, Germany, 2008-03-02 - 2008-03-02. (2008)

2007

Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Sigle, W.:
EELS investigations of reference niobium oxides and anodically grown niobium oxide layers. In: Microscopy and Microanalysis 2007, 1274CD-1275CD (Hrsg. Marko, M.; Scott, J.H.; Vicenzi, E.; Dekanich, S.; Frafjord, J.; Kotula, P.; McKernan, S.; Shields, J.). Microscopy and Microanalysis 2007, Fort Lauderdale, Florida, USA, 2007-08-05 - 2007-08-05. Cambridge University Press, New York, USA (2007)


Burghard, Z.; Pitta Bauermann, L.; Tucic, A.; Jeurgens, L. P. H.; Srot, V.; Bellina, P.; Lipowsky, P.; Hoffmann, R. C.; Gutmanas, E.; Bill, J.; Aldinger, F.
Nacre-like TiO2- and ZnO-based organic/inorganic hybrid systems. In: Synthesis, Processing and Properties of Organic/Inorganic Hybrid Materials (Hrsg. Laine, R.M.; Sanchez, C.; Barbé, C.; Schubert, U.). MRS Spring Meeting 2007, San Francisco, USA, 2007-04-09 - 2007-04-09. MRS, Warrendale, PA (2007)


Djurovic, D.; Zinkevich, M.; Boskovic, S.; Srot, V.; Aldinger, F.:
Densification behaviour of nano-sized CeO2. In: Research Trends in Contemporary Materials Science. YUCOMAT VIII. Proceedings. Selected papers
presented at the 8th Conference of the Yugoslav Materials Research Society, 189-194 (Hrsg. Uskoković, D. P.; Milonjić, S. K.; Raković, D. I.). YUCOMAT VIII, Herceg Novi [Montenegro], 2006-09-04 - 2006-09-04. (2007)


Essers, E.; Matijevic, M.; Benner, G.; Höschen, R.; Sigle, W.; Koch, C.:
Analytical performance of the SESAM microscope. In: Microscopy & Microanalysis, 18-19 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.), Saarbrücken, 2007-09-02 - 2007-09-02. (2007)


Gec, M.; Srot, V.; Jeon, J. H.; van Aken, P. A.; Ceh, M.:
Comparison of chemical composition of PMN-PT thin foils prepared by ion-milling and wedge preparation technique. In: Proceedings of the 8th Multinational Congress on Microscopy, 251-252 8th Multinational Congress on Microscopy, Prague, 2007-06-17 - 2007-06-17. The Czechoslovak Microscopy Society, České Budějovice (2007)


Haider, M.; Loebau, U.; Höschen, R.; Müller, H.; Uhlemann, S.; Zach, J.:
State of the development of a Cc & Cs corrector for TEAM. In: Microscopy and Microanalysis 2007, 1156CD-1157CD (Hrsg. Marko, M.; Scott, J. H.; Vicenzi, E.; Dekanich, S.; Frafjord, J.; Kotula, P.; McKernan, V.; Shields, J.). Microscopy and Microanalysis 2007, Fort Lauderdale, Florida, USA, 2007-08-05 - 2007-08-05. Cambridge University Press, New York, USA (2007)


Koch, C. T.; Rahmati, B.; van Aken, P. A.; Rühle, M.; Bäurer, M.; Hoffmann, M.:
Mapping grain boundary potentials by inline electron holography. In: Microscopy & Microanalysis, 334-335 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.), Saarbrücken, 2007-09-02 - 2007-09-02. (2007)


Koch, C. T.:
Solving the dynamic inversion problem. In: Microscopy & Microanalysis, 118-119 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.), Saarbrücken, 2007-09-02 - 2007-09-02. (2007)


Kroll, P.; Horvath-Bordon, E.; Riedel, R.; McMillan, P. F.; van Aken, P. A.; Miehe, G.; Hoppe, P.; Boehler, R.:
Single-crystals of a new carbon nitride phase with all-sp3 carbon. In: Materials Research at High Pressure (Hrsg. Goncharov, A.; Bini, R.; Riad Manaa, M.; Hemley, R. J.). Materials Research Society Fall Meeting. Symposium PP "Materials Research at High Pressure", Boston, Mass., 2006-11-27 - 2006-11-27. Materials Research Society, Warrendale, PA (2007)


Liu, Z.; Srot, V.; van Aken, P. A.; Yang, J. C.; Rühle, M.:
Nanostructure characterization of iron catalyst assisted SiC nanowires. In: Microscopy and Microanalysis 2007, 754CD-755CD (Hrsg. Marko, M.; Scott, H.; Vicenzi, E.; Dekanich, S.; Frafjord, J.; Kotula, P.; McKernan, S.; Shields, J.). Microscopy and Microanalysis 2007, Fort Lauderdale, Florida, USA, 2007-08-05 - 2007-08-05. Cambridge University Press, New York, USA (2007)


Sigle, W.; Gu, L.; Srot, V.; Koch, C.; van Aken, P. A.:
Low-loss EELS with monochromated electrons. In: Microscopy & Microanalysis, 54-55 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.), Saarbrücken, 2007-09-02 - 2007-09-02. (2007)


van Aken, P. A.; Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.:
The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM. In: Microscopy and Microanalysis 2007, 862CD-863CD (Hrsg. Marko, M.; Scott, J.H.; Vicenzi, E.; Dekanich, S.; Frafjord, J.; Kotula, P.; McKernan, V.; Shields, J.). Microscopy and Microanalysis 2007, Fort Lauderdale, Florida, USA, 2007-08-05 - 2007-08-05. Cambridge University Press, New York, USA (2007)


van Aken, P. A.; Gu, L.; Goll, D.; Schütz, G.:
Electron magnetic linear dichroism (EMLD) and electron magnetic circular dichroism (EMCD) in electron energy-loss spectroscopy. In: Microscopy & Microanalysis, 426-427 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.), Saarbrücken, 2007-09-02 - 2007-09-02. (2007)

2006

Bhattacharyya, S.; Koch, C. T.; Rühle, M.:
Determination of projected potential profiles across interfaces using through focal series reconstruction. In: Microscopy and Microanalysis, 1016-1017 (2006)


Bhattacharyya, S.; Koch, C. T.; Rühle, M.:
Measuring projected potential profiles across interfaces by reconstructing the exit face wave function from through focal series images. In: Proceedings of the 16th International Microscopy Congress 2006, 1138-1138 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Essers, E.; Höschen, R.; Matijevic, M.; Benner, G.; Koch, C. T.:
Requisites for ultimate energy resolution EELS and band gap measurements. In: Microscopy and Microanalysis, 1148-1149 Microscopy and Microanalysis 2006, Chicago, IL, USA, 2006-07-30 - 2006-07-30. Cambridge University Press, Canbridge, UK (2006)


Essers, E.; Höschen, R.; Matijevic, M.; Benner, G.; Koch, C. T.:
Requisites for ultimate energy resolution EELS and band gap measurements in TEM. In: Proceedings of the 16th International Microscopy Congress 2006, 810-810 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Goll, D.; Breitling, A.; Goo, N. H.; Sigle, W.; Hirscher, M.; Schütz, G.:
Hard magnetic FePt thin films and nanostructures in L1(0) phases. In: Journal of the Iron and Steel Research International, 97-101 19th International Workshop on Rare Earth Permanent Magnets and Their Applications, Beijing, PR China, 2006-08-30 - 2006-08-30. (2006)


Gu, L.; Srot, V.; Sigle, W.; Koch, C. T.; Scholz, F.; Kirchner, C.; Thapa, S. B.; Rühle, M.:
EELS studies of the bandgap in GaN using monochromated electrons. In: Proceedings of the 16th International Microscopy Congress 2006, 1484-1484 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Hollensteiner, S.; Sigle, W.; Spiecker, E.; Jäger, W.:
EELS/ELNES and STEM inverstigations of Cu-rich layers and nanostructures formed by metal deposition on chalcogenide crystal surfaces. In: Proceedings of the 16th International Microscopy Congress 2006, 1850-1850 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Howe, J. M.; Gautam, A. R. S.; Chatterjee, K.; Phillipp, F.:
Atomic-level dynamic behavior of a diffuse interphase boundary in a Au-Cu alloy. In: Proceedings of the 16th International Microscopy Congress 2006, 924-924 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Koch, C. T.; Bhattacharyya, S.; Rühle, M.:
Diffraction tomography and its application to integranular glassy films in ceramics. In: Proceedings of the 16th International Microscopy Congress 2006, 999-999 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Niwase, K.; Phillipp, F.; Seeger, A.:
Self-organized nanostructures generated on metal surfaces by electron irradiation. In: Proceedings of the 16th International Microscopy Congress 2006, 1250-1250 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Sigle, W.; Srot, V.; Gu, L.; Koch, C. T.; Höschen, R.; Essers, E.; Matijevic, M.; Benner, G.; Thesen, A.; Rühle, M.
Low-loss electron spectroscopy using monochromated electrons. In: Proceedings of the 16th International Microscopy Congress 2006, 811-811 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)


Sigle, W.; Brunner, D.; Zhang, Z.; Taeri, S.; Sarbu, C.:
Dislocations in strontium titanate. In: Microscopy and Microanalysis, 892 CD-893 CD (2006)


Srot, V.; Scheu, C.; Tchernychova, E.; Sigle, W.; Fischer, H.; Janek, J.; Rühle, M.:
EELS and EDX study of Pt/YSZ interfaces. In: Proceedings of the 16th International Microscopy Congress 2006, 1321-1321 16th International Microscopy Congress - IMC16, Sapporo, Japan, 2006-09-03 - 2006-09-03. International Federation of Societies in Microscopy (2006)

2005

López, G. A.; Zieba, P.; Sigle, W.; Mittemeijer, E. J.:
Analysis of the Diffusion Profile Along Migrating Grain Boundaries. In: Proceedings of DIMAT 2004, 1230-1233 (Hrsg. Danielewski, M.; Filipek, R.; Kozubski, R.; Kucza, W.; Zieba, P.; Zurek, Z.). DIMAT 2004. 6th International Conference on Diffusion in Materials, Cracow [Poland], 2004-07-18 - 2004-07-18. Trans Tech Publications Ltd, Zuerich-Uetikon (2005)

2004

Carle, V.; Täffner, U.; Kopp, W.-U.:
Gemeinschaftsversuch an einem Sandwichverbund. In: Fortschritte in der Metallographie. 35. Metallographie-Tagung, 43-48 (Hrsg. Portella, P.). Fortschritte in der Metallographie. 35. Metallographie-Tagung, Berlin, 2003-09-17 - 2003-09-17. Werkstoffinformationsgesellschaft, Frankfurt (2004)


Jin-Phillipp, N.Y.; Kelsch, M.; Sycha, M.; Thomas, J.; Rühle, M.:
Cross-sectional TEM study on metal/carbon nanotube interface. In: Proceedings Microscopy and Microanalysis 2004, Suppl. 2, 280CD-281CD (Hrsg. Anderson, I.M.; Price, R.; Hall, E.; Clark, E.; McKernan, S.). Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 2004-08-01 - 2004-08-01. Press Syndicate of the University of Cambridge, New York, USA (2004)


Koch, C. T.:
Solving the phase problem for electron diffraction on non-centrosymmetric membrane protein structures. In: Proceedings of the 13th European Microscopy Congress, Vol. 3, 247-248 13th European Microscopy Congress, Antwerpen [Belgium], 2004-08-22 - 2004-08-22. Belgian Society for Microscopy (2004)


Koch, C. T.:
Solving the phase problem for electron diffraction of non-centrosymmetric two dimensional organic crystals using the example of membrane proteins. In: Microscopy and Microanalysis, 414-415 Microscopy & Microanalysis 2004, Savannah, GA [USA], 2004-08-01 - 2004-08-01. (2004)


Koch, C. T.; Bhattacharyya, S.; Subramaniam, A.; Rühle, M.:
Determining thermodynamic and structural parameters of thin amorphous intergranular films by electron diffraction. In: Proceedings of the 13th European Microscopy Congress, Vol. 2, 37-38 13th European Microscopy Congress, Antwerpen [Belgium], 2004-08-22 - 2004-08-22. Belgian Society for Microscopy (2004)


Sigle, W.:
EELS and EFTEM studies at low energy losses and high energy resolution. In: Proceedings Microscopy and Microanalysis 2004, Suppl. 2, 258CD-259CD (Hrsg. Anderson, I.M.; Price, R.; Hall, E.; Clark, E.; McKernan, S.). Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 2004-08-01 - 2004-08-01. Press Syndicate of the University of Cambridge, New York, USA (2004)


Srot, V.; Recniknik, A.; Mirtic, B.:
The chemistry of rotational twin boundaries in natural ZnS. In: Microscopy and Microanalysis, 316-317 (2004)

2002

Jin-Phillipp, N. Y.; Sata, N.; Maier, J.; Scheu, C.; Rühle, M.:
Layer and defect structures of Ba F2/CaF2 multilayers. In: Proceedings Microscopy and Microanalysis 2002, 1164-1165 (Hrsg. Voelkl, E.; Piston, D.; Gauvin, R.; Lockley, A. J.; Bailey, G. W.; McKernan, S.). Microscopy and Microanalysis 2002, Québec City [Quebec, Canada], 2002-08-05 - 2002-08-05. (2002)


Koch, C. T.; Spence, J.:
Automated solution of nanocrystal structures from CBED patterns. In: Proceedings of the 15th International Congress on Electron Microscopy (Hrsg. Engelbrecht, J.; Sevell, T.; Witcomb, M.; Cross, R.; Richards, P.). ICEM 15. 15th International Congress on Electron Microscopy, Durban [South Africa], 2002-09-01 - 2002-09-01. Microscopy Society of Southern Africa, Onderstepoort (2002)


Sigle, W.; Zhang, Z. L.; Rühle, M.:
Structure and Chemistry of Dislocations and its Impact on the Plastic and Transport Behaviour of SrTiO3. In: Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1, 893-894 (Hrsg. Engelbrecht, J.; Sevell, T.; Witcomb, M.; Cross, R.; Richards, P.). ICEM 15. 15th International Congress on Electron Microscopy. Microscopy Society of Southern Africa, Durban/South Africa (2002)


Sigle, W.; Krämer, S.; Zern, A.; Cai, Y.; Eigenthaler, U.; Hahn, K.; Rühle, M.:
The SESAM Project - Present State and Applications. In: Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1, 329-330 (Hrsg. Engelbrecht, J.; Sevell, T.; Witcomb, M.; Cross, R.; Richards, P.). ICEM 15. 15th International Congress on Electron Microscopy, Durban [South Africa], 2002-09-01 - 2002-09-01. Microscopy Society of Southern Africa, Onderstepoort (2002)

2001

Sommer, E.; Terry, S. G.; Sigle, W.; Mennicke, C.; Gemming, T.; Meier, G. H.; Levi, C. G.; Rühle, M.:
Metallic precipitate formation during alumina growth in a FeCrAl-based thermal barrier coating model system. In: High Temperature Corrosion and Protection of Materials 5. Proceedings of the 5th International Symposium on High Temperature Corrosion and Protection of Materials, 671-678 (Hrsg. Streiff, R.). High Temperature Corrosion and Protection of Materials 5, Lez Embiez, France, 2000-05-22 - 2000-05-22. Trans Tech Publications Ltd., Zürich-Uetikon (2001)

2000

Goll, D.; Sigle, W.; Hadjipanayis, G. C.; Kronmüller, H.:
Micromagnetic and microstructural analysis of the temperature dependence of the coercive field of Sm2(Co, Cu, Fe, Zr)17 permanent magnets. In: Proceedings of the 16th International Workshop on Rare-Earth Magnets and Their Applications, 61-70 (Hrsg. of Metals, J. I.). 16th International Workshop on Rare-Earth Magnets and Their Applications. Kaneko, H.; Homma, M.; Okada, M., Sendai (2000)


Rühle, M.; Elsässer, C.; Scheu, C.; Sigle, W.:
The role of microanalysis in the characterization of interfaces. In: Microbeam Analysis 2000: Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies, 1-2 (Hrsg. Williams, D. B.; Shimizu, R.). Microbeam Analysis 2000. Second Conference of the International Union of Microbeam Analysis Societies, Kailua-Kona, Hawai, 2000-07-09 - 2000-07-09. Institute of Physics Publ., Bristol (2000)


Rühle, M.; Elsässer, C.; Scheu, C.; Sigle, W.:
Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)? In: Microscopy and Microanalysis 2000, 188-189 (Hrsg. Bailey, G.W.). Microscopy and Microanalysis 2000, Philadelphia, Pa., 2000-08-13 - 2000-08-13. Springer, New York (2000)


van Benthem, K.; Scheu, C.; Sigle, W.; Rühle, M.:
Electronic structure investigations of metal/strontiumtitanate interfaces. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, 421-422 (Hrsg. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 2000-07-09 - 2000-07-09. Czechoslovak Society for Electron Microscopy, Brno (2000)

 
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