Publications 2017
Real-time Algorithm to Determine the Period and Phase of Reflection High-Energy Electron Diffraction (RHEED) Intensity Oscillations During Epitaxial Growth
W. Braun
Journal of Crystal Growth 477, 50-53 (2017)
Monitoring Surface Roughness During Film Growth Using Modulated RHEED Intensity Oscillations
W. Braun
Journal of Crystal Growth 477, 34-39 (2017)
Thermionic Energy Conversion in the 21st Century: Advances and Opportunities for Space and Terrestrial Applications
D.B. Go, J.R. Haase, J. George, J. Mannhart, R. Wanke, A. Nojeh, and R. Nemanich
Frontiers in Mechanical Engineering 3, 13 (2017)
In-gap States in Superconducting LaAlO3-SrTiO3 Interfaces Observed by Tunneling Spectroscopy
L. Kuerten, C. Richter, N. Mohanta, T. Kopp, A. Kampf, J. Mannhart, and H. Boschker
Physical Review B 96, 014513 (2017)
arXiv: 1704.02122
High-Temperature Latent-Heat Energy Storage Concept Based on Thermoelectronic Energy Conversion
W. Voesch, R. Wanke, I. Rastegar, W. Braun, A. Kribus, and J. Mannhart
Energy Technology 5, 2234-43 (2017)
Thermoelectronic Energy Conversion: Concepts and Materials
R. Wanke, W. Voesch, I. Rastegar, A. Kyriazis, W. Braun, and J. Mannhart
MRS Bulletin 42, 7, 518-24 (2017)
In-situ Work Function Measurements in Thermoelectronic Generators
I. Rastegar, W. Voesch, R. Wanke, W. Braun, and J. Mannhart
Technical Digest, International Vacuum Nanoelectronics Conference (IVNC), Regensburg (2017)
Chemical Diffusion Coefficient of Undoped and Cr-doped NiO
Y. Unutulmazsoy, R. Merkle, J. Mannhart, and J. Maier
Solid State Ionics 309, 110-117 (2017)
ZIF-8 Films Prepared by Femtosecond Pulsed-Laser Deposition
D. Fischer, A. von Mankowski, A. Ranft, S.K. Vasa, R. Linser, J. Mannhart, and B.V. Lotsch
Chem. Mater. 29 (12), 5148-55 (2017)
Two-Port-Network-Based Method to Measure Electrical Characteristics of MIS Devices with Ultrathin Barriers
R. Berktold and J. Mannhart
IEEE Transactions on Electron Devices 64, 2625-8 (2017)
In situ Polarized Neutron Reflectometry: Epitaxial Thin-Film Growth of Fe on Cu(001) by dc Magnetron Sputtering
W. Kreuzpaintner, B. Wiedemann, J. Stahn, J-F. Moulin, S. Mayr, T. Mairoser, A. Schmehl, A. Herrnberger, P. Korelis, M. Haese, J. Ye, M. Pomm, P. Böni, and J. Mannhart
Physical Review Applied 7, 054004 (2017)
The Oxidation Kinetics of Thin Nickel Films Between 250 and 500 °C
Y. Unutulmazsoy, R. Merkle, D. Fischer, J. Mannhart, and J.Maier
Physical Chemistry Chemical Physics 19, 9045-52 (2017)
Electrical Transport Measurements of Thin Film Samples under High Hydrostatic Pressure
J. Zabaleta, S.C. Parks, B. Baum, A. Teker, K. Syassen, and J. Mannhart
Review of Scientific Instruments 88, 033901 (2017)
Quantum-Matter Heterostructures
H. Boschker and J. Mannhart
Annu. Rev. Condens. Matter Phys. 8, 154-64 (2017)
arXiv: 1607.07239
Research Update: Ionotronics for Long-Term Data Storage Devices
Y. Unutulmazsoy, R. Merkle, I. Rastegar, J. Maier, and J. Mannhart
APL Materials 5, 042302 (2017)