Surface and Interface Characterization

Surface and Interface Characterization

The department has access to various surface and interface characterization methods within the institute and in collaboration with close research partners. The employed tools range from topographic characterization to electronic and optical spectroscopic methods. Below is a list of the routinely used techniques by our department.

 

▪   Raman spectroscopy

▪   Confocal microscopy

▪   Scanning force microscopy

▪   Transmission and scanning electron microscopy

▪   Laser desorption ionization time-of-flight mass spectrometry

▪   Ellipsometry

 

The following techniques are provided by the interface analysis service group of the institute.

 

▪   Photoelectron spectroscopy (XPS, AES, UPS, ARPES)

▪   Low energy electron diffraction

▪   Time-of-flight secondary ion mass spectrometry

▪   Fourier-transform infrared spectroscopy

 
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