Extra information

Publication: "Preparation of High-Quality Samples for MEMS-Based In-Situ (S)TEM Experiments" highlighted on LinkedIn

https://www.linkedin.com/feed/update/urn:li:activity:7038795512522711041

ESTEEM3 interview

https://www.esteem3.eu/news?backRef=104&

news=ESTEEM3_inteviews_Vesna_Srot_from_Stuttgart_Center_for_Electron_Microscopy


Protochips Webinar Series "Sample Preparation in In Situ TEM"


I presented my recently developed FIB-based methodology for the preparation of high-quality samples for in-situ electrical and electrothermal (S)TEM experiments as a part of Protochips Webinar Series "Sample Preparation in In Situ TEM".

The title of my presentation was "Preparation of High-Quality Samples for MEMS-Based In-Situ Electrical and Electro-Thermal (S)TEM Experiments"

Announcement on Linkedin:

https://www.linkedin.com/posts/protochips_insitutem-nanotechnology-nanoscience-activity-7135613563284463616-VQWR

Please see recording here:


https://www.youtube.com/watch?v=ZjnSc6NPmEA

https://www.youtube.com/watch?v=ZjnSc6NPmEA&t=4s> &t=4s

https://www.protochips.com/news-and-events/past-webinar-series/







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