Photo of the JEOL ARMD Microscope

JEOL ARMD - Probe Corrected

The probe-corrected JEOL ARMD-TEM, operating at 60 or 200 kV, is specially designed for the investigation of phenomena at the very low energy-loss region below 1 eV. For this, it is equipped with a double Wien filter monochromator and the CEOS Energy-Filtering and Imaging Device (CEFID), which allow for an energy resolution of below 20 meV. Furthermore, using a condenZero liquid helium holder, samples can be cooled down to below 10 K. In combination with its various advanced detectors and wide-gap objective lens pole piece, a broad spectrum of 4D STEM, in-situ and tomography studies can be realized.
 

Gun Schottky emission (Phase I)
Cold field emission (Phase II) - scheduled 2026
Spatial resolution 0.096 nm at 200 kV
Energy resolution 0.015 eV
Tilt angles ± 35°
Heating holder 1200 °C
Cooling holder <10 K (condenZero Liquid Helium Holder)
Other holders Tomography, Protochips FUSION Select, Mel-Build Double-Tilt Cooling Vacuum Transfer, JEOL High Count Analytical Double Tilt
Energy filter CEOS CEFID
Detectors Annular bright-field, annular dark-field, 8-segmented annular all-field (SAAF)
Cameras Pre- and post-filter TVIPS XF416R CMOS, pre-filter Quantum Detector Merlin, post-filter Dectris ELA
EDX system Dual JEOL detector

TEM Comparison Table

TEM Holder List

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