Instrumentation

JEOL ARM200F - Probe Corrected

The probe-corrected ARM200F is a state-of-the-art (S)TEM with exceptional stability and the capability to produce a very small probe. The microscope is also equipped with advanced EELS and EDX systems for chemical analysis. High energy resolution at high spatial resolution is thus obtainable. The system is set up for operation at voltages of 30 kV, 60 kV, 80 kV and 200 kV. Sample holders for in-situ heating and cooling as well as for electron tomography are available.

Gun cold field emission
Spatial resolution 0.063 nm at 200 kV
Energy resolution 0.3 eV
Tilt angles ± 20°
Heating holder 900°C
Cooling holder -160°C
Other holders tomography
Energy filter Gatan GIF Quantum
EDX system JEOL

TEM Comparison Table

 
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