Atomic and electronic properties of solid state surfaces and interfaces

Research report (imported) 2006 - Max Planck Institute for Solid State Research

Authors
Starke, Ulrich
Departments
Wissenschaftliche Servicegruppe "Grenzflächenanalytik" (Priv.-Doz. Dr. Ulrich Starke)
MPI für Festkörperforschung, Stuttgart
Summary
The investigation of surfaces, interfaces and thin films represents a major subject of state of the art solid state research. The morphology of surfaces on an atomic scale can be measured in real space using a variety of microscopy methods. The detailed atomic structure of the surface is determined using a combination of electron spectroscopy methods, low-energy electron diffraction and scanning tunneling microscopy. An overview of research in surface and interface analysis is demonstrated by a set of exemplary experiments.

For the full text, see the German version.

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