Atomic and electronic properties of solid state surfaces and interfaces
Research report (imported) 2005 - Max Planck Institute for Solid State Research
The investigation of surfaces, interfaces and thin films represents a major subject of state of the art solid state research. The morphology of surfaces on an atomic scale can be measured in real space using a variety of microscopy methods. The detailed atomic structure of the surface is determined using a combination of electron spectroscopy methods, low-energy electron diffraction and scanning tunneling microscopy. An overview of research in surface and interface analysis is demonstrated by a set of exemplary experiments.