StEM | Max Planck Institut für Festkörperforschung

Contact / Kontakt

Prof. Dr. Peter van Aken

Phone:+49 711 689-3529Fax:+49 711 689-3522

StEM trat dem Institut bei

Das Stuttgarter Zentrum für Elektronenmikroskopie (StEM) des Max-Planck-Instituts für Intelligente Systeme (MPI-IS) trat am 1. April 2015 unserem Institut bei. Der Transfer des von Prof. Dr. Peter van Aken geleiteten Zentrums resultierte aus der wissenschaftlichen Neuausrichtung des MPI-IS und stärkt unsere analytischen Möglichkeiten. Wir freuten uns, unsere neuen Kolleginnen und Kollegen am 1. April 2015 mit einer kleinen Veranstaltung im Auditorium zu begrüßen zu können.

The image-aberration-corrected <strong>JEOL ARM200F</strong> incorporates the latest developments in TEM to give excellent spatial resolution in HRTEM imaging. It has a cold field-emission gun, with a range of available accelerating voltages (30 kV, 60 kV, 80 kV and 200 kV). It has state-of-the art EELS and EDX systems for advanced chemical analysis. The system includes HAADF, ABF, and BF detectors, and can accommodate sample holders for in-situ heating and cooling as well as for electron tomography.

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The image-aberration-corrected JEOL ARM200F incorporates the latest developments in TEM to give excellent spatial resolution in HRTEM imaging. It has a cold field-emission gun, with a range of available accelerating voltages (30 kV, 60 kV, 80 kV and 200 kV). It has state-of-the art EELS and EDX systems for advanced chemical analysis. The system includes HAADF, ABF, and BF detectors, and can accommodate sample holders for in-situ heating and cooling as well as for electron tomography. [less]

The Zeiss Sub-Electron-volt Sub-Angstrom Microscope (<strong>SESAM</strong>) is a unique TEM, with a monochromator and an in-column MANDOLINE energy filter. The microscope column is suspended from an ultra-stable support frame to provide excellent isolation. The SESAM was developed to provide the best performance in analytical electron microscopy combined with very high spatial resolution.

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The Zeiss Sub-Electron-volt Sub-Angstrom Microscope (SESAM) is a unique TEM, with a monochromator and an in-column MANDOLINE energy filter. The microscope column is suspended from an ultra-stable support frame to provide excellent isolation. The SESAM was developed to provide the best performance in analytical electron microscopy combined with very high spatial resolution. [less]

The <strong>JEOL ARM 1250</strong> was designed to maximize image resolution through the use of a high accelerating voltage. It has a LaB<sub>6</sub> source that can be operated at an accelerating voltage of up to 1250 kV. The large size of the components required to support this voltage mean this TEM takes up two storeys, which is a factor in the rarity of instruments with this design. This TEM is suitable for in-situ experiments with a video system installed and an incorporated drift-correction system.

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The JEOL ARM 1250 was designed to maximize image resolution through the use of a high accelerating voltage. It has a LaB₆ source that can be operated at an accelerating voltage of up to 1250 kV. The large size of the components required to support this voltage mean this TEM takes up two storeys, which is a factor in the rarity of instruments with this design. This TEM is suitable for in-situ experiments with a video system installed and an incorporated drift-correction system. [less]

StEM has joined FKF

On April 1, 2015 the Stuttgart Center for Electron Microscopy (StEM) of the Max Planck Institute for Intelligent Systems (MPI-IS) has joined our Institute, MPI-FKF. The transfer of the Center, led by Prof. Dr. Peter van Aken, is an outcome of of the scientific evolution of MPI-IS and further strengthens our analytical capabilities. To celebrate the merger, a welcome event was held in the auditorium on April 1.

Research Topic

<p>We studied of ZrO<sub>2</sub>–La<sub>2/3</sub>Sr<sub>1/3</sub>MnO<sub>3</sub> pillar–matrix thin films which were found to show anomalous magnetic and electron transport properties. With the application of an aberration-corrected transmission electron microscope, interfacial chemistry, and atomic-arrangement of the system, especially of the pillar–matrix interface were revealed at atomic resolution. Minor amounts of Zr were found to occupy Mn positions within the matrix. The Zr concentration reaches a minimum near the pillar–matrix interface accompanied by oxygen vacancies. La and Mn diffusion into the pillar was revealed at atomic resolution and a concomitant change of the Mn valence state was observed.</p>
<p> </p>
D. Zhou, W. Sigle, E. Okunishi, Y. Wang, M. Kelsch, H.-U. Habermeier, P.A. van Aken<br />Interfacial chemistry and atomic arrangement of ZrO<sub>2</sub>–La<sub>2/3</sub>Sr<sub>1/3</sub>MnO<sub>3</sub> pillar-matrix structures<br /> APL Materials <strong>2</strong>, 127301 (2014)

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We studied of ZrO₂–La_2/3Sr_1/3MnO₃ pillar–matrix thin films which were found to show anomalous magnetic and electron transport properties. With the application of an aberration-corrected transmission electron microscope, interfacial chemistry, and atomic-arrangement of the system, especially of the pillar–matrix interface were revealed at atomic resolution. Minor amounts of Zr were found to occupy Mn positions within the matrix. The Zr concentration reaches a minimum near the pillar–matrix interface accompanied by oxygen vacancies. La and Mn diffusion into the pillar was revealed at atomic resolution and a concomitant change of the Mn valence state was observed.

D. Zhou, W. Sigle, E. Okunishi, Y. Wang, M. Kelsch, H.-U. Habermeier, P.A. van Aken
Interfacial chemistry and atomic arrangement of ZrO₂–La_2/3Sr_1/3MnO₃ pillar-matrix structures
APL Materials 2, 127301 (2014)