Extra information
Publication: "Preparation of High-Quality Samples for MEMS-Based In-Situ (S)TEM Experiments" highlighted on LinkedIn
https://www.linkedin.com/feed/update/urn:li:activity:7038795512522711041
ESTEEM3 interview
https://www.esteem3.eu/news?backRef=104&
news=ESTEEM3_inteviews_Vesna_Srot_from_Stuttgart_Center_for_Electron_Microscopy
Protochips Webinar Series "Sample Preparation in In Situ TEM"
I presented my recently developed
FIB-based methodology for the preparation of high-quality samples
for in-situ electrical and electrothermal (S)TEM experiments
as a part of Protochips Webinar Series "Sample Preparation in In
Situ TEM".
The title of my presentation was "Preparation of High-Quality Samples for MEMS-Based In-Situ Electrical and Electro-Thermal (S)TEM Experiments"
Announcement on Linkedin:
Please see recording here:https://www.youtube.com/watch?v=ZjnSc6NPmEA
https://www.youtube.com/watch?v=ZjnSc6NPmEA&t=4s> &t=4s
https://www.protochips.com/news-and-events/past-webinar-series/