StAR-M: Stuttgart Atomic Resolution Microscopy Symposium
The Stuttgart Center for Electron Microscopy would like to thank everybody who helped to make the inauguration ceremony for its two new Cs-corrected JEOL JEM-ARM200F microscopes and StAR-M 2014 − Stuttgart Atomic Resolution Microscopy Symposium a great success.
StEM was very happy to receive and very appreciative of all the genuinely expressed good wishes for productive and innovative research to be carried out on the two new TEMs.
Here is a short report on the event, and some photos are here.
Plasmonic Response and Forces in Sub-Nanoscale Objects
Electron Energy Loss Spectroscopy at High Energy and High Spatial Resolution for Plasmonics and Oxides with Highly-Correlated Electrons
Quantitative In-Situ (S)TEM and DTEM: From High Spatial Resolution to High Temporal Resolution
Towards Three-Dimensional Characterisation of Magnetic Moments Inside Individual Nanocrystals in the TEM
Quantitative STEM - Development of Methods and Applications to Materials Problems
Advanced Instrumentation for High Resolution TEM and STEM
In-situ Electron Holography for the Measurement of Fields
Structural Studies of Defects and Defect Dynammics in Graphene
Multiple-Scattering Assisted Electron Tomography
Nanoscale Optics with Fast Electrons?
Methodical Progress in Electron Holography
How can Atomic Resolution TEM Contribute to the Development of New Steels?
Recent Developments in the Manipulation and Analysis of Radiation Sensitive 2-D Materials
STEM-EELS Imaging of Complex Oxides
Atom-by-Atom Characterisation and Defect Engineering in Low-Dimensional Materials
High Resolution Imaging by Aberration Corrected Microscopy
EMCD - Magnetic Chiral Dichroism in the Electron Microscope
Low Voltage Electron Microscopy for Single Atom Spectroscopy
Progress and Challenges in Electron Vortex Research
Theoretical Approaches for Quantification of Atomic Resolution X-Ray Maps in Aberration-Corrected STEM