AFM (Atomic Force Microscopy)
In contrast to conventional tapping mode AFM where the cantilever oscillates at or near its resonance frequency in PeakForce TappingTM a force/distance curve is aquired in every point. For this, the cantilever oscillates with a frequency in the range of 1-2 kHz, far below its resonance frequency. When the cantilever approaches, it will first experience attractive forces. For smaller tip/sample distances, these are overlaid by repulsive forces. At a certain force set point the tip is retracted again. Due to this very controlled tip trajectory, it is much easier to automatically adjust all imaging parameters like the force set point and the feedback loop. Additionally, it gives qualitative - and if well calibrated - also quantitative insight into mechanical properties like adhesion, dissipation and modulus of the surface on a local scale.
A multitude of different operations are available:
- Quantitative nanomechanical mapping (QNM)
- Conductive AFM
- Tunneling AFM (TUNA)
- Scanning Capacitance Microscopy (SCM)
- Kelvin Probe Microscopy (KPFM)
- Lift modes for magnetic and electric force modes, surface potential mapping and many more
- Liquid cell
Please contact Kathrin Küster if you are interested to use the AFM.