Our ambient atomic force microscope with crosstalk elimination offers a lateral resolution down to 5 nm. It is an important tool that provides feedback during sample fabrication. It possesses a height resolution of better than 0.1 nm. Single atomic layers of for instance graphene, boron-nitride and molybdenum-disulfide can be distinguished. In addition to recording the topography, it is possible to map the conductance, study magnetic interactions and do force spectroscopy. Due to an acoustic enclosure and an active piezo table for decoupling purposes, scan acquisition times of hours are possible for acquiring high resolution images up to 4096 x 4096 pixels within a scan range of 50 x 50 µm. Such scans aid precision alignment in electron beam lithography used to pattern leads, gates or etching masks.