Sample Preparation

Successful TEM depends on many parameters, one being the preparation of high quality specimens. With the tremendous advances in spatial and spectral resolution of state of the art microscopes, the quality of the samples examined has become a major limiting factor for quantitative analysis at the nanometer scale.

StEM has advanced specimen preparation facilities and the know-how to meet today’s requirements for a broad range of material systems. The methods employed include plan-view / cross-section preparation of hard materials using Automated Tripod Polishing with low-energy / low temperature ion beam milling, Ultramicrotomy for both organic and inorganic materials, electrolytic polishing of metals and semiconductors, as well as Focus Ion Beam (FIB) and NanoMill for precision sample machining.

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