Instrumentation

JEOL ARMD - Probe Corrected

The probe-corrected JEOL ARMD-TEM, operating at 60 or 200 kV, is specially designed for the investigation of phenomena at the very low energy-loss region below 1 eV. For this, it is equipped with a double Wien filter monochromator and the CEOS Energy-Filtering and Imaging Device (CEFID), which allow for an energy resolution of below 20 meV. Furthermore, using a condenZero liquid helium holder, samples can be cooled down to below 10 K. In combination with its various advanced detectors and wide-gap objective lens pole piece, a broad spectrum of 4D STEM, in-situ and tomography studies can be realized.
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JEOL ARM200F - Probe Corrected

The probe-corrected ARM200F is a state-of-the-art (S)TEM with exceptional stability and the capability to produce a very small probe. The microscope is also equipped with advanced EELS and EDX systems for chemical analysis. High energy resolution at high spatial resolution is thus obtainable. The system is set up for operation at voltages of 30 kV, 60 kV, 80 kV and 200 kV. Sample holders for in situ heating and cooling as well as for electron tomography are available.
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JEOL ARM200F - Image Corrected

The image-corrected ARM200F incorporates the latest developments in TEM to give excellent spatial resolution in HRTEM imaging. It has a cold field-emission gun, with a range of available accelerating voltages (30 kV, 60 kV, 80 kV and 200 kV). It has state-of-the art EELS and EDX systems for advanced chemical analysis. The system includes HAADF, ABF, and BF detectors, and can accommodate sample holders for electron tomography and in situ investigations concerning variations in temperature and atmosphere.
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Philips CM200

The CM200 is a widely-used microscope, excellent for conventional TEM work. It has a LaB₆ source, operated with a 200kV accelerating voltage. This TEM is ideal for bright field and dark field imaging, and for dislocation and defect analysis using diffraction contrast imaging, including the weak-beam dark field technique. The available range for tilting is large and the microscope can accommodate a cooling holder.
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FEI FIB SCIOS

Our FIB-SEM system FEI Scios is mainly used for site-specific and high-precision preparation of TEM lamellae. A vacuum transfer system for air-sensitive samples is available, which allows the complete process from FIB preparation to TEM investigation to be done without air contact.
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Thermo Fisher Scientific SCIOS 2

The SCIOS 2 is dedicated for TEM lamella preparation. It is equipped with a SE, a BSE and a STEM detector. The SEM resolution is around 1 nm, the FIB resolution is approximately 5 nm. The tilt range of the specimen stage is between -15° to +90°. As precursor gases for beam-induced deposition Pt and C are available. more

ZEISS SEM DSM 982 Gemini

The ZEISS DSM 982 Gemini is used for high-resolution imaging. It offers a resolution between 1 and 4 nm, the tilt range of the specimen stage is from -15° to +90°. It is equipped with SE, BSE and EDX detectors.
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