The CM200 is a widely-used microscope, excellent for conventional TEM work. It has a LaB6 source, operated with a 200kV accelerating voltage. This TEM is ideal for bright field and dark field imaging, and for dislocation and defect analysis using diffraction contrast imaging, including the weak-beam dark field technique. The available range for tilting is large and the microscope can accommodate a cooling holder.
|Image resolution||0.27 nm|