Research Scientific Facilities Stuttgart Center for Electron Microscopy (StEM) Facilities Sample Preparation Sample Preparation FEI SCIOS: 1 nm SEM resolution, 5 nm FIB resolution, -15° to +90° tilt range, BSE detector. FEI SCIOS: 1 nm SEM resolution, 5 nm FIB resolution, -15° to +90° tilt range, BSE detector. Fischione NanoMill® TEM specimen preparation system Fischione NanoMill® TEM specimen preparation system Page«|1|2|3|4|5|»